$XRD Diffractometer : XRD Diffractometer LXRD-A10$

XRD Diffractometer LXRD-A10

Name: XRD Diffractometer LXRD-A10
Brand: Labtron.online
SKU: LXRD-A10
Rating: 4.7 (202 reviews)

XRD Diffractometer LXRD-A10 contains tube current up to 5 to 80 mA with a dimension 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm and are designed for quality diffraction data, combined with ease of use and flexibility to quickly switch to different applications, This multipurpose diffractometers are all equipped with X-ray tuble of glass tube, ceramic tube, ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo) and is coupled with an auto-switching dual wavelength optic. It have Low maintenance, high performance system and designed with Horizontal Goniometer structure and proportional/Scintillation counters detector.

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X-ray Tuble	Glass tube, Ceramic tube, Ripple Ceramic tube: Cu, Fe, Co, Cr, Mo etc., Power 2 kW
Focus Size	1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability	≤ 0.01 %
Tube Current	5 to 80 mA
Tube Voltage	10 to 60 kV
Rated Power	3 kW
Goniometer Structure	Horizontal (Ø to 2 Ø )
Radius of Diffraction	185 mm
Scanning Range	0 to 164
Scanning Speed	0.0012º to 70 º min
Maximum Resolving Speed	100 º / min
Scanning Mode	Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping scanning
Angle Repeatable Accuracy	1 / 1000 º
Minimal Stepping Angle	1 / 1000 º
Detector	Proportional/Scintillation counters
Maximum Counting rate of Linearity	5 × 10⁵ CPS (with the compensate function of dropout counting)
Energy Resolution Ratio	≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion	Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure	≤ 0.01 %
Scattered Rays Dose	≤ 1 µ Sv/h (without X-ray protective device)
Instrument Integrative Stability	≤ 0.5 %
Dimension	1100 × 850 × 1750 mm
Weight	About 25 kg

Diffractometer is equipped with X-ray tuble of glass tube, ceramic tube, and ripple ceramic tube with many different X-ray source materials (Cu, Fe, Co, Cr and Mo)
Coupled with an auto-switching dual wavelength optic
Horizontal Goniometer structure
Proportional/Scintillation counters detector
For testing unknown samples it has phase identification and phase analysis for known mixed samples
Crystal structure varies with temperature (high temperature vice versa) factor and chemical information tested by X-ray diffraction test device
Equipped with programmable operation, integrated structure design with easy operation and well-designed outlook
High throughput with high accuracy diffraction angle measurement
Scanning range and Scanning speed are well design in equipment

Best suited for the research and industrial product analysis with perfect combination of conventional analysis crucial measurement product and for academics and researchers in different application areas.